TVXA-ENIF1 (SAXS) | Techvalley Co., Ltd.


Analysis X-ray

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X射线小角度散射分析仪
纳米结构分析设备

TVXA-ENIF1 (SAXS)

适用领域

  • Analysis
  • - X射线小角度散射分析仪 (Small Angle X-ray Scattering)
  • - 半导体材料,蛋白质,药物等的分析
  • - 纳米结构分析设备
  • - 尺寸,尺寸分布,形状,方向
  • - 纳米材料,纳米复合材料,高分子分析

分析信息

产品规格

产品规格
Incident beam Wavelength 1.54A / 8keV (Cu Kα)
Divergence ~ 0.4mrad FW20%M Both Planes
Beam size at focus 1.1 X 1.5㎟ at Mirror Exit
Distance Sample-to-Detector ~ 1.45 Meter
Slit Beam collimation 2 Sets of adjustable slits
Beam stopper Size 1.5 ~ 5Ø
Detector 2D-Positioning sensitive detector
Scattered beam Qmin
Beam flux at sample
position
(50kV, 0.6mA)
0.1076

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