X射线小角度散射分析仪
纳米结构分析设备
TVXA-ENIF1 (SAXS)
适用领域
-
Analysis
- X射线小角度散射分析仪 (Small Angle X-ray Scattering)
- 半导体材料，蛋白质，药物等的分析
- 纳米结构分析设备
- 尺寸，尺寸分布，形状，方向
- 纳米材料，纳米复合材料，高分子分析
分析信息
产品规格
| Incident beam | Wavelength | 1.54A / 8keV (Cu Kα) |
|---|---|---|
| Divergence | ~ 0.4mrad FW20%M Both Planes | |
| Beam size at focus | 1.1 X 1.5㎟ at Mirror Exit | |
| Distance | Sample-to-Detector | ~ 1.45 Meter |
| Slit | Beam collimation | 2 Sets of adjustable slits |
| Beam stopper | Size | 1.5 ~ 5Ø |
| Detector | 2D-Positioning sensitive detector | |
| Scattered beam | Qmin Beam flux at sample position (50kV, 0.6mA) |
0.1076 |
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